Spire to Launch Spi-EL Solar Module Tester at the SNEC 2011 in Shanghai

Spire has declared that it is planning to launch a new and advanced metrology solution, the Spi-EL Electroluminescence Solar Module Tester at the SNEC 2011 International PV Power Generation and Exhibition, which is being conducted in Shanghai in China.

The Spi-EL Series utilizes EL to recognize micro-cracks and other imperceptible defects, which are found in the modules. The testers would use cooled near infrared charge-coupled device camera technology which would picture every solar cell with resolutions much lower than 200 µm per pixel, which is equal to a 60 mega pixel image for the total module.

Spire’s team members were occupying booth E3-003 at the Shanghai New International Expo Center. Mark Little from the Sales and Marketing Team, Shih-Yuan (Andy) Lin, Ed Hurley and Peter Di Sesse from Spire would be attending the conference.