KMSA to Unveil New PV Measurement Instruments at Optics and Photonics Show in San Diego

Konica Minolta Sensing Americas, Inc (KMSA), a company involved in the measurement of light, shape and color for industrial purposes, will introduce photovoltaic measurement instruments as well as characterization instruments at the SPIE Optics and Photonics 2010 show to be conducted during August 3-5, 2010 in San Diego, California.

The entry of KMSA into this market was propelled by a capital investment of $20 million from Konarka Technologies and Konica Minolta Holdings for developing and distributing thin-film PVs.

KMSA is expected to showcase its pseudo reference cell, a new product brought out by the combined efforts by The National Institute of Advanced Industrial Science and Technology (AIST) and Konica Minolta Sensing. The utility of the reference cell is that it acts as a standard calibration point for ensuring consistent measurements in new photovoltaic cells. The reference cell has been specifically developed for adjusting the solar simulators’ illumination meant for multi-junction solar cells. The reference cell is enabled with a superior spectral response in comparison with current technology.